decision-models-for-industrial-image-qc
This record belongs to a study that asks whether structured decision models (JEV, a hosted model, and Clef-Flash, an open-weight model) can detect manufacturing defects as well as few-shot CLIP with fewer labeled images, and give calibrated class probabilities. The record holds the decisions (who proposed and who decided each one), the process events with their times, the milestones and open items, the paid-call budgets, and the software versions. The experiment itself (each trial, its settings and its result) is in experiment_log.md and results/ at the root of the repository.
Status
Current milestone: none. Next milestone: M2 Full MSEC 2027 paper. Date: 2026-10-20.
Milestones
- done M1 Tune JEV on validation, test once, compare with CLIP and Clef-Flash (MSEC 2027 abstract)
- next M2 Full MSEC 2027 paper
- planned M3 R package decisionqc
Decisions by decider
- Fadel M. Megahed: 51
- Claude Code: 12